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Organic materials for molecular quantum bits
Tuček, Marek ; Bábor, Petr (referee) ; Čechal, Jan (advisor)
In this thesis we briefly outline the properties and utilization of metal phthalocyanines, the procedure of iron phthalocyanine thin film deposition on Si(100), the supplementary post-deposition analysis by XPS and the equipment used to measure X-ray reflectivity. Further we describe the theoretical description of physical background of X-ray diffraction on a crystal, the measurement of X-ray reflectivity and evaluation of acquired data, focusing on determination of the thin film thickness, identification of its crystal structure and lattice parameters. It has been found out that iron phthalocyanine thin films deposited on a substrate at room temperature grow as an alpha-phase in the shape of needles perpendicular to substrate surface, so the film thickness, due to high rougness of the film, can be only estimated with the help of Scherrer equation for long depositions. In the case of shorter depositions (and thus lower roughness) the Kiessig fringes method can be used. By the post-deposition annealing we were not able to induce a phase transition; at required temperatures all the material on the substrate evaporated. By a deposition on a substrate heated to 160°C we acquired considerably rough film with unclear crystalline phase.
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Study of thin films of molecular nano-magnets prepared by Langmuir-Blodgett technique and drafting of an adapted Langmuir trough
Vaverka, Jan ; Neugebauer, Petr (referee) ; Novák, Jiří (advisor)
This diploma thesis focuses on studies of deposition of molecular nanomagnets doubledecker dysporsium phtalocyanine via Langmuir-Blodgett method. The thesis describes the influence of deposition parameters on structure of deposited molecular layer of doubledecker dysporsium phtalocyanine. The prepared molecular layers are analysed by X-ray reflectivity and Atomic force microscopy. Moreover, the proposal of structural changes of KSV Minimicro instrument, used for Langmuir Blodgett deposition, is described. The intended result is Langmuir trough of bigger dimensions than the recent one, which would enable to distribute molecular layers numbering about magnitude of hundreds.
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Microstructure and properties of multiferroic complex oxide thin films prepared by pulsed laser deposition method
Machovec, Petr ; Dopita, Milan (advisor)
Title: Microstructure and properties of multiferroic complex oxide thin films prepared by pulsed laser deposition method Author: Petr Machovec Department: Department of Condensed Matter Physics Supervisor: RNDr. Milan Dopita, Ph.D., Department of Condensed Matter Physics Abstract: In the frame of this thesis, structure, microstructure, and real structure of multiferroic epitaxial layers of LuFeO3 were studied by means of X-ray reflectivity and X-ray diffraction. In theoretical part the theory of X-ray scattering on crystalline layers is described. Standard description of X-ray reflectivity on series of rough layers is presented. Moreover, a model of X-ray scattering on mosaic layer is described. For experimental part of the work three samples were prepared by pulsed laser deposition method. First sample on sapphire substrate (Al2O3), second on platinum layer deposited on sapphire substrate and third on yttrium stabilized zirconia substrate. From the X-ray reflectivity curves the parameters such as layer thickness, interface roughness, surface roughness and material density, were determined. By analysing measured reciprocal space maps, lattice parameters and mosaic model parameters, such as mean mosaic block size, mosaic block size distribution, mosaic block misorientation and residual microstrain, were...
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Microstructure and properties of multiferroic complex oxide thin films prepared by pulsed laser deposition method
Machovec, Petr ; Dopita, Milan (advisor) ; Kužel, Radomír (referee)
Title: Microstructure and properties of multiferroic complex oxide thin films prepared by pulsed laser deposition method Author: Petr Machovec Department: Department of Condensed Matter Physics Supervisor: RNDr. Milan Dopita, Ph.D., Department of Condensed Matter Physics Abstract: In the frame of this thesis, structure, microstructure, and real structure of multiferroic epitaxial layers of LuFeO3 were studied by means of X-ray reflectivity and X-ray diffraction. In theoretical part the theory of X-ray scattering on crystalline layers is described. Standard description of X-ray reflectivity on series of rough layers is presented. Moreover, a model of X-ray scattering on mosaic layer is described. For experimental part of the work three samples were prepared by pulsed laser deposition method. First sample on sapphire substrate (Al2O3), second on platinum layer deposited on sapphire substrate and third on yttrium stabilized zirconia substrate. From the X-ray reflectivity curves the parameters such as layer thickness, interface roughness, surface roughness and material density, were determined. By analysing measured reciprocal space maps, lattice parameters and mosaic model parameters, such as mean mosaic block size, mosaic block size distribution, mosaic block misorientation and residual microstrain, were...
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Study of thin films of molecular nano-magnets prepared by Langmuir-Blodgett technique and drafting of an adapted Langmuir trough
Vaverka, Jan ; Neugebauer, Petr (referee) ; Novák, Jiří (advisor)
This diploma thesis focuses on studies of deposition of molecular nanomagnets doubledecker dysporsium phtalocyanine via Langmuir-Blodgett method. The thesis describes the influence of deposition parameters on structure of deposited molecular layer of doubledecker dysporsium phtalocyanine. The prepared molecular layers are analysed by X-ray reflectivity and Atomic force microscopy. Moreover, the proposal of structural changes of KSV Minimicro instrument, used for Langmuir Blodgett deposition, is described. The intended result is Langmuir trough of bigger dimensions than the recent one, which would enable to distribute molecular layers numbering about magnitude of hundreds.
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Organic materials for molecular quantum bits
Tuček, Marek ; Bábor, Petr (referee) ; Čechal, Jan (advisor)
In this thesis we briefly outline the properties and utilization of metal phthalocyanines, the procedure of iron phthalocyanine thin film deposition on Si(100), the supplementary post-deposition analysis by XPS and the equipment used to measure X-ray reflectivity. Further we describe the theoretical description of physical background of X-ray diffraction on a crystal, the measurement of X-ray reflectivity and evaluation of acquired data, focusing on determination of the thin film thickness, identification of its crystal structure and lattice parameters. It has been found out that iron phthalocyanine thin films deposited on a substrate at room temperature grow as an alpha-phase in the shape of needles perpendicular to substrate surface, so the film thickness, due to high rougness of the film, can be only estimated with the help of Scherrer equation for long depositions. In the case of shorter depositions (and thus lower roughness) the Kiessig fringes method can be used. By the post-deposition annealing we were not able to induce a phase transition; at required temperatures all the material on the substrate evaporated. By a deposition on a substrate heated to 160°C we acquired considerably rough film with unclear crystalline phase.
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